System for testing Nakagami fading channel and verification method thereof

A system for testing a Nakagami fading channel, comprising:

• a signal generator;
• a Nakagami fading channel simulator;
• and
• a computer,
• wherein the signal generator is unidirectionally connected to the Nakagami fading channel simulator and the computer respectively by using SMA cables, and the Nakagami fading channel simulator is unidirectionally connected to the computer by using a general purpose interface bus;
• the signal generator is configured to output a sine wave signal x whose frequency is f, and the sine wave signal x is transmitted to the Nakagami fading channel simulator and the computer respectively by using the SMA cables;
• the Nakagami fading channel simulator is configured to generate the Nakagami fading channel during a testing process, and during the testing process, a maximum Doppler frequency shift fd, loss, a Rician factor K, a phase, and a Nakagami fading factor m are set for the Nakagami fading channel simulator, wherein m is 1 or (K+1)2/(2K+1), one Nakagami fading channel path channel is opened, and the remaining path channels are closed, wherein during the testing process, the Nakagami fading channel simulator is configured to transmit the Nakagami fading channel to the computer through the SMA cables;
• and
• the computer is configured to receive the Nakagami fading channel from the Nakagami fading channel simulator through the SMA cables and the computer is configured to analyze the Nakagami fading channel, which is a radio frequency output from the Nakagami fading channel simulator, by obtaining performance indexes of the Nakagami fading channel on a time domain and a frequency domain to verify accuracy of a Nakagami fading channel model,
• wherein data processing of operation and analysis is performed on a computer, and the method comprises the following steps:
• Step S1:
• start a program, perform parameter initialization, and set a sampling frequency and a carrier frequency of a testing system;
• step S2:
• verify time domain fading characteristics of the Nakagami fading channel;
• step S3:
• verify first-order statistics characteristics of the Nakagami fading channel;
• step S4:
• verify second-order statistics characteristics of the Nakagami fading channel;
• and
• step S5:
• end the program,
• wherein verifying the time domain fading characteristics of the Nakagami fading channel in the step S2 is verifying a waveform fluctuation rate and a fluctuation range on the time domain under different Nakagami fading factors and specifically comprises:
• obtaining the Nakagami fading channel by means of enveloping of the sine wave signal obtained by e computer, then observing whether an amplitude waveform of the Nakagami fading channel quickly fluctuates on the time domain, wherein a fluctuation range of the amplitude waveform of the Nakagami fading channel is 30 dB to −60 dB;
• verifying whether the Nakagami fading channel conforms to features of a Rayleigh fading channel when the Nakagami fading factor m is 1;
• and verifying whether the Nakagami fading channel conforms to features of a Rician fading channel when the Nakagami fading factor m is (K+1)2/(2K+1).