Resistive test-probe tips

A test-probe tip comprising:

• a tip component having a first end configured to electrically connect to a device under test, and a second end that is opposite the first end of the tip component along a signal-flow axis of the test-probe tip;
• a resistive element electrically connected to the second end of the tip component along the signal-flow axis, the resistive element being configured to provide electrical impedance to an electrical signal passing through the resistive element;
• a compliance member configured to allow movement of the tip component in a first axial direction along the signal-flow axis of the test-probe tip when a mechanical force applied to the tip component in the first axial direction and to cause movement of the tip component in a second axial direction along the signal-flow axis of the test-probe tip, the second axial direction being opposite to the first axial direction, when the mechanical force applied to the tip component is removed or reduced;
• and
• a structural member, the structural member structurally coupling the tip component to the compliance member;
• an air gap between the structural member and the resistive element;
• in which the first layer and the second layer are concentric;
• in which, in a cross-section perpendicular to the signal-flow axis of the test-probe tip, the second layer surrounds the first layer.