Spectrometer with wide-scan tunable diode laser

A spectrometer comprising:

• a laser light source;
• a control unit;
• and
• at least one detector positioned such that light emitted by the laser light source is detected by the at least one detector after passing through a sample gas, the control unit causing:
• first scanning, by the control unit using a first set of laser spectrometer operating parameters, a first wavelength range by adjusting a wavelength of light of a beam emitted by the laser light source and passing through the sample gas, the first wavelength range encompassing a first spectral feature corresponding to a first constituent;
• at least one second scanning, upon completion of the first scanning and by the control unit using a second set of laser spectrometer operating parameters at least partially different from the first set of laser spectrometer operating parameters, a second wavelength range by adjusting the wavelength of light emitted from the laser light source and passing through the sample gas, the second wavelength range having a second spectral feature corresponding to at least one second constituent;
• adjusting at least one operating parameter between the first scanning and the second scanning to separate an overlap of spectral peaks;
• and
• determining, by the control unit, based on both of the first scanning and the at least one second scanning, a first concentration of the first constituent and a second concentration of the at least one second constituent.

A non-transitory computer program product storing instructions which, when executed by at least one data processor forming part of a control unit controlling at least one of a laser light source and at least one detector positioned such that light emitted by the laser light source is detected by the at least one detector after passing through a sample gas, result in the control unit executing operations comprising:

• first scanning, by the control unit using a first set of laser spectrometer operating parameters, a first wavelength range by adjusting a wavelength of light of a beam emitted by the laser light source and passing through the sample gas, the first wavelength range encompassing a first spectral feature corresponding to a first constituent;
• at least one second scanning, upon completion of the first scanning and by the control unit using a second set of laser spectrometer operating parameters at least partially different from the first set of laser spectrometer operating parameters but with a temperature of the laser light source being the same in both the first scanning and the at least one second scanning, a second wavelength range by adjusting the wavelength of light emitted from the laser light source and passing through the sample gas, the second wavelength range having a second spectral feature corresponding to at least one second constituent;
• adjusting at least one operating parameter between the first scanning and the second scanning to separate an overlap of spectral peaks;
• and
• determining, by the control unit, based on both of the first scanning and the at least one second scanning, a first concentration of the first constituent and a second concentration of the at least one second constituent.