Far-infrared spectroscopy device
AssigneeHitachi High-Tech Corporation
InventorsKei Shimura, Mizuki Oku, Kenji Aiko
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AssigneeHitachi High-Tech Corporation
InventorsKei Shimura, Mizuki Oku, Kenji Aiko
Estimating the term…
This far-infrared spectroscopy device is provided with: a variable wavelength far-infrared light source that generates first far-infrared light; an illuminating optical system that irradiates a sample with the first far-infrared light; a detecting nonlinear optical crystal that converts second far-infrared light into near-infrared light using pump light, said second far-infrared light having been transmitted from the sample; and a far-infrared image-forming optical system that forms an image of the sample in the detecting nonlinear optical crystal. The irradiation position of the first far-infrared light on the sample does not depend on the wavelength of the first far-infrared light.
A far-infrared spectroscopy device comprising:
Dependencies are inferred from the claim text.