X-ray CT apparatus including a photon-counting detector and circuitry configured to set a control parameter corresponding to a position of each detecting element in the photon-counting detector
AssigneeCanon Medical Systems Corporation
InventorsEmi Tamura, Hiroaki Miyazaki, Hiroaki Nakai, Toshiyuki Ono
Life of this patent
Estimating the term…
Abstract
An X-ray CT apparatus according to one embodiment includes a photon counting detector and a processing circuitry. The photon counting detector includes a plurality of detecting elements configured to detect X-rays. The processing circuitry is configured to set a control parameter corresponding to a position of each detecting element of the plurality of detecting elements in the photon counting detector.
Claims27
An X-ray CT apparatus comprising:
- a photon counting detector including a plurality of detecting elements, each detecting element of the plurality of detecting elements is configured to detect X-rays;
- and
- a processing circuitry configured to set a control parameter corresponding to a position of each detecting element of the plurality of detecting elements in the photon counting detector, wherein the processing circuitry sets a longer processing time in counting circuitry that is connected to a detecting element of the plurality of detecting elements for which an X-ray incident dose is smaller than a threshold, as compared to counting circuitry that is connected to a detecting element of the plurality of detecting elements for which an X-ray incident dose is equal to or larger than the threshold.
An X-ray CT apparatus comprising:
- a photon counting detector including a plurality of detecting elements, each detecting element of the plurality of detecting elements is configured to detect X-rays;
- and
- a processing circuitry configured to set a control parameter corresponding to a position of each detecting element of the plurality of detecting elements in the photon counting detector, wherein
- the photon counting detector includes a plurality of detection circuitries, each detection circuitry of the plurality of detection circuitries includes:
- a detecting element of the plurality of detecting elements configured to detect X-ray photons;
- and
- a counting circuitry connected to the detecting element and configured to count the X-ray photons detected by the detecting element, and
- the processing circuitry sets, as the control parameter, a processing time corresponding to the position of each detecting element of the plurality of detecting elements in the photon counting detector, in the counting circuitry connected to each detecting element of the plurality of detecting elements at a time of imaging, wherein
- the processing circuitry sets a processing time corresponding to an imaging angle in each counting circuitry of a plurality of counting circuitries.
An X-ray CT apparatus comprising:
- a photon counting detector including a plurality of detecting elements, each detecting element of the plurality of detecting elements is configured to detect X-rays;
- and
- a processing circuitry configured to set a control parameter corresponding to a position of each detecting element of the plurality of detecting elements in the photon counting detector, wherein
- the photon counting detector includes a plurality of detection circuitries, each detection circuitry of the plurality of detection circuitries includes:
- a detecting element of the plurality of detecting elements configured to detect X-ray photons;
- and
- a counting circuitry connected to the detecting element and configured to count the X-ray photons detected by the detecting element, and
- the processing circuitry sets, as the control parameter, a processing time corresponding to the position of each detecting element of the plurality of detecting elements in the photon counting detector, in the counting circuitry connected to each detecting element of the plurality of detecting elements at a time of imaging, wherein
- the processing circuitry sets a longer processing time in a counting circuitry that is connected to a detecting element disposed in a first region that is a central portion in a channel direction in the photon counting detector, as compared to a counting circuitry that is connected to a detecting element disposed in a second region that is an edge portion in the channel direction.
An X-ray CT apparatus comprising:
- a photon counting detector including a plurality of detecting elements, each detecting element of the plurality of detecting elements is configured to detect X-rays;
- and
- a processing circuitry configured to set a control parameter corresponding to a position of each detecting element of the plurality of detecting elements in the photon counting detector, wherein
- the photon counting detector includes a plurality of detection circuitries, each detection circuitry of the plurality of detection circuitries includes:
- a detecting element of the plurality of detecting elements configured to detect X-ray photons;
- and
- a counting circuitry connected to the detecting element and configured to count the X-ray photons detected by the detecting element, and
- the processing circuitry sets, as the control parameter, a processing time corresponding to the position of each detecting element of the plurality of detecting elements in the photon counting detector, in the counting circuitry connected to each detecting element of the plurality of detecting elements at a time of imaging, wherein
- the processing circuitry sets a processing time for a current view in a counting circuitry connected to each detecting element of the plurality of detecting elements, on a basis of an X-ray dose that has been incident on each detecting element of the plurality of detecting elements for a past view preceding the current view.
An X-ray CT apparatus comprising:
- a photon counting detector including a plurality of detecting elements, each detecting element of the plurality of detecting elements is configured to detect X-rays;
- a processing circuitry configured to set a control parameter corresponding to a position of each detecting elements of the plurality of detecting elements in the photon counting detector;
- and
- an acquisition circuitry configured to acquire a count result of the photon counting detector, wherein
- the processing circuitry corrects the count result so that an X-ray dose and the count result have a linear relationship and reconstructs an image based on the corrected count result.
An X-ray CT apparatus comprising:
- a photon counting detector including a plurality of detecting elements, each detecting element of the plurality of detecting elements is configured to detect X-rays;
- and
- a processing circuitry configured to set a control parameter corresponding to a position of each detecting element of the plurality of detecting elements in the photon counting detector, wherein
- the photon counting detector includes a plurality of detection circuitries, each detection circuitry of the plurality of detection circuitries includes:
- a detecting element of the plurality of detecting elements configured to detect X-ray photons;
- and
- a counting circuitry connected to the detecting element and configured to count the X-ray photons detected by the detecting element, and
- the processing circuitry sets, as the control parameter, a processing time corresponding to the position of each detecting element of the plurality of detecting elements in the photon counting detector, in the counting circuitry connected to each detecting element of the plurality of detecting elements at a time of imaging, wherein
- the processing circuitry sets a processing time of each counting circuitry of a plurality of counting circuitries to be an integral time in each counting circuitry of the plurality of counting circuitries.
An X-ray CT apparatus comprising:
- a photon counting detector including a plurality of detecting elements, each detecting element of the plurality of detecting elements is configured to detect X-rays;
- and
- a processing circuitry configured to set a control parameter corresponding to a position of each detecting element of the plurality of detecting elements in the photon counting detector, wherein
- the processing circuitry sets, as the control parameter, a driving voltage corresponding to the position of each detecting element of the plurality of detecting elements in the photon counting detector, in each detecting element of the plurality of detecting elements at a time of imaging, wherein
- each detecting element of the plurality of detecting elements includes a scintillator and a photo sensor, and
- the processing circuitry sets a driving voltage corresponding to a position of each scintillator of a plurality of scintillators in the photon counting detector, in the photo sensor corresponding to each scintillator of the plurality of scintillators at a time of imaging,
- wherein the processing circuitry sets, in the photo sensor corresponding to each scintillator of the plurality of scintillators, a driving voltage that is based on an X-ray dose incident on each scintillator of the plurality of scintillators.
An X-ray CT apparatus comprising:
- a photon counting detector including a plurality of detecting elements, each detecting element of the plurality of detecting elements is configured to detect X-rays;
- and
- a processing circuitry configured to set a control parameter corresponding to a position of each detecting element of the plurality of detecting elements in the photon counting detector, wherein
- the processing circuitry sets, as the control parameter, a driving voltage corresponding to the position of each detecting element of the plurality of detecting elements in the photon counting detector, in each detecting element of the plurality of detecting elements at a time of imaging, wherein
- each detecting element of the plurality of detecting elements includes a scintillator and a photo sensor, and
- the processing circuitry sets a driving voltage corresponding to a position of each scintillator of a plurality of scintillators in the photon counting detector, in the photo sensor corresponding to each scintillator of the plurality of scintillators at a time of imaging,
- wherein the processing circuitry sets a driving voltage corresponding to an imaging angle in each photo sensor of a plurality of photo sensors.
An X-ray CT apparatus comprising:
- a photon counting detector including a plurality of detecting elements, each detecting element of the plurality of detecting elements is configured to detect X-rays;
- and
- a processing circuitry configured to set a control parameter corresponding to a position of each detecting element of the plurality of detecting elements in the photon counting detector, wherein
- the processing circuitry sets, as the control parameter, a driving voltage corresponding to the position of each detecting element of the plurality of detecting elements in the photon counting detector, in each detecting element of the plurality of detecting elements at a time of imaging, wherein
- each detecting element of the plurality of detecting elements includes a scintillator and a photo sensor, and
- the processing circuitry sets a driving voltage corresponding to a position of each scintillator of a plurality of scintillators in the photon counting detector, in the photo sensor corresponding to each scintillator of the plurality of scintillators at a time of imaging,
- wherein the processing circuitry sets a larger driving voltage in a photo sensor of a detecting element disposed in a first region that is a central portion in a channel direction in the photon counting detector, as compared to a photo sensor of a detecting element disposed in a second region that is an edge portion in the channel direction.
An X-ray CT apparatus comprising:
- a photon counting detector including a plurality of detecting elements, each detecting element of the plurality of detecting elements is configured to detect X-rays;
- and
- a processing circuitry configured to set a control parameter corresponding to a position of each detecting element of the plurality of detecting elements in the photon counting detector, wherein
- the processing circuitry sets, as the control parameter, a driving voltage corresponding to the position of each detecting element of the plurality of detecting elements in the photon counting detector, in each detecting element of the plurality of detecting elements at a time of imaging, wherein
- each detecting element of the plurality of detecting elements includes a scintillator and a photo sensor, and
- the processing circuitry sets a driving voltage corresponding to a position of each scintillator of a plurality of scintillators in the photon counting detector, in the photo sensor corresponding to each scintillator of the plurality of scintillators at a time of imaging,
- wherein the processing circuitry sets a driving voltage for a current view in a photo sensor corresponding to each scintillator of the plurality of scintillators, on a basis of an X-ray dose that has been incident on each scintillator of the plurality of scintillators for a past view preceding the current view.
An X-ray CT apparatus comprising:
- a photon counting detector including a plurality of detecting elements, each detecting element of the plurality of detecting elements is configured to detect X-rays;
- a processing circuitry configured to set a control parameter corresponding to a position of each detecting element of the plurality of detecting elements in the photon counting detector;
- and
- an acquisition circuitry configured to acquire a count result of the photon counting detector, wherein
- the processing circuitry sets, as the control parameter, a driving voltage corresponding to the position of each detecting element of the plurality of detecting elements in the photon counting detector, in each detecting element of the plurality of detecting elements at a time of imaging, wherein
- the processing circuitry corrects the count result so that an X-ray dose and the count result have a linear relationship and reconstructs an image based on the corrected count result.
An X-ray CT apparatus comprising:
- a photon counting detector including a plurality of detecting elements, each detecting element of the plurality of detecting elements is configured to detect X-rays;
- and
- a processing circuitry configured to set a control parameter corresponding to a position of each detecting element of the plurality of detecting elements in the photon counting detector, wherein
- the photon counting detector includes a plurality of detection circuitries, each detection circuitry of the plurality of detection circuitries includes:
- a detecting element of the plurality of detecting elements configured to detect X-ray photons;
- and
- a counting circuitry connected to the detecting element and configured to count the X-ray photons detected by the detecting element, and
- the processing circuitry:
- sets, as the control parameter, a processing time corresponding to the position of each detecting element of the plurality of detecting elements in the photon counting detector, in a counting circuitry connected to each detecting element of the plurality of detecting elements at a time of imaging, and
- sets, as the control parameter, a driving voltage corresponding to the position of each detecting element of the plurality of detecting elements in the photon counting detector, in each detecting element of the plurality of detecting elements at the time of imaging.
Dependencies are inferred from the claim text.