Memory device and method for handling interrupts thereof
AssigneeWinbond Electronics Corp.
InventorsCheng-Han Lee, Chien-Ti Hou, Ying-Te Tu
Life of this patent
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AssigneeWinbond Electronics Corp.
InventorsCheng-Han Lee, Chien-Ti Hou, Ying-Te Tu
Estimating the term…
A memory device is provided. The memory device includes: a memory cell array; a monitoring circuit, and an event-checking circuit. The monitoring circuit is configured to detect one or more event parameters of the memory cell array, wherein the one or more event parameters correspond to one or more interrupt events of the memory cell array. The event-checking circuit is configured to determine whether to assert an interrupt signal according to the one or more event parameters detected by the monitoring circuit. In response to the event-checking circuit determining to assert the interrupt signal, a processor handles the one or more interrupt events of the memory device according to the interrupt signal.
A memory device, comprising:
A method for handling interrupts in a memory device, wherein the memory device comprises a memory cell array and a control logic, and the control logic controls the memory cell array in response to a command from a processor, wherein the control logic comprises a mode register that pre-records a plurality of operation modes of the memory cell array and a status of the interrupt event corresponding to each event parameter, the method comprising:
Dependencies are inferred from the claim text.