System and method for transforming observed metrics into detected and scored anomalies
AssigneeAnodot Ltd.
InventorsYoni Yom Tov Ben Simhon, David Drai, Ira Cohen
Life of this patent
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AssigneeAnodot Ltd.
InventorsYoni Yom Tov Ben Simhon, David Drai, Ira Cohen
Estimating the term…
A system includes a normal behavior characterization module configured to receive values for a first metric of a plurality of metrics and generate a baseline profile indicating normal behavior of the first metric based on the received values. The system also includes an anomaly identification module configured to identify an anomaly in response to present values of the metric deviating outside the baseline profile. The system also includes an anomaly behavior characterization module configured to analyze a plurality of prior anomalies identified by the anomaly identification module and develop a model of the anomalies of the first metric. The system also includes an anomaly scoring module configured to determine a first score for a present anomaly detected by the anomaly identification module for the first metric. The first score is based on characteristics of the present anomaly and the model of the anomalies of the first metric.
A system comprising:
A non-transitory computer-readable medium storing processor-executable instructions, the instructions comprising:
A method of monitoring a system that generates a plurality of metrics, the method comprising:
Dependencies are inferred from the claim text.