Vertical probe testing head with improved frequency properties

A testing head comprising:

• at least one guide provided with a plurality of guide holes, the plurality of guide holes including a plurality of groups of guide holes, and a plurality of contact elements housed in the plurality of guide holes, the plurality of contact elements including a plurality of groups of contact elements, wherein:
• the at least one guide comprises a plurality of conductive layers, each conductive layer:
• including holes of a corresponding group of the plurality of groups of guide holes, and electrically connecting a corresponding group of contact elements, of the groups of contact elements, housed in the guide holes of the corresponding group of guide holes, the contact elements of the corresponding group of contact elements being adapted to carry a same type of signal,
• the at least one guide is a ceramic multilayer comprising a plurality of non-conductive layers made of a ceramic material, and
• the conductive layers are arranged on respective faces of a layer of the plurality of non-conductive layers,
• wherein the non-conductive layers are arranged one upon the other and form the at least one multilayer guide, each conductive layer being separated from an adjacent conductive layer by one of the non-conductive layers, and wherein the at least one guide including the conductive layers is a lower guide or an intermediate guide of the testing head.

A testing head comprising:

• at least one guide provided with a plurality of guide holes, the plurality of guide holes including a plurality of groups of guide holes, and
• a plurality of contact elements housed in the plurality of guide holes, the plurality of contact elements including a plurality of groups of contact elements, wherein:
• the at least one guide comprises a plurality of conductive layers, each conductive layer:
• including holes of a corresponding group of the plurality of groups of guide holes and electrically connecting a corresponding group of contact elements, of the groups of contact elements, housed in the guide holes of the corresponding group of guide holes, the contact elements of the corresponding group of contact elements being adapted to carry a same type of signal, and
• the conductive layers are arranged on respective faces of a layer of the plurality of non-conductive layers,
• the at least one guide comprises an organic multilayer associated with a rigid support,
• the organic multilayer includes a plurality of layers made of an organic material,
• the organic material layers form non-conductive layers on which at least one conductive layer of said the plurality of conductive layers is arranged,
• wherein the non-conductive layers are arranged one upon the other and form the at least one multilayer guide, each conductive layer being separated from an adjacent conductive layer by one of the non-conductive layers, and wherein the at least one guide including the conductive layers is a lower guide or an intermediate guide of the testing head.