A testing apparatus for testing a plurality of chips each having a plurality of contacts, comprising:
- a chip carrying device including:
- at least one circuit board;
- and
- a plurality of electrically connecting units disposed on the at least one circuit board for carrying the chips, wherein each of the electrically connecting units includes:
- a main body having a top wall and an annular wall, wherein the top wall has an opening, one end of the annular wall is connected to a peripheral edge of the top wall, and the other end of the annular wall is disposed on the at least one circuit board, wherein the top wall, the annular wall, and the at least one circuit board jointly define an accommodating slot, and wherein the top wall has an inner surface arranged in the accommodating slot and an outer surface that is opposite to the inner surface;
- a supporting structure disposed on the at least one circuit board and arranged in the accommodating slot;
- a lift structure arranged in the accommodating slot and including a base portion, a carrying portion extending from the base portion, and a plurality of retaining portions extending from the carrying portion along a direction away from the base portion, wherein the base portion is arranged in the accommodating slot, and the carrying portion is at least partially arranged in the opening, wherein at least part of the retaining portions protrude from the opening of the main body, and the retaining portions and the carrying portion jointly form a chip receiving slot for accommodating the chips, and wherein the lift structure has a plurality of connecting holes penetratingly formed through the base portion and the carrying portion;
- at least one elastic assembly arranged in the accommodating slot, wherein one end of the at least one elastic assembly is fixed to the lift structure, and the other end of the at least one elastic assembly is fixed to the supporting structure, and wherein the at least one elastic assembly is configured to be pressed to generate a return force that pushes the base portion to abut against the inner surface of the top wall, so that the lift structure and the supporting structure have a gap there-between;
- and
- a plurality of probe assemblies connected to the at least one circuit board and each having a first end and an opposite second end, wherein the first ends of the probe assemblies are fixed to the supporting structure, and the second ends of the probe assemblies are respectively arranged in the connecting holes;
- and
- a pressing device configured to simultaneously press the retaining portions of the electrically connecting units so as to move the retaining portions of each of the electrically connecting units toward the corresponding accommodating slot,
- wherein in each of the electrically connecting units, when the chip receiving slot receives the corresponding chip and the retaining portions are not pressed by the pressing device, the probe assemblies in the connecting holes do not connect to the contacts of the corresponding chip, and
- wherein in each of the electrically connecting units, when the chip receiving slot receives the corresponding chip and the pressing device is abutted against the outer surface of the top wall, the retaining portions protruding from the opening of the main body are pressed by the pressing device so as to move toward the accommodating slot, the probe assemblies are respectively abutted against the contacts of the corresponding chip for establishing an electrical connection between the probe assemblies and the corresponding chip.