Test socket with insertion portion
AssigneeYamaichi Electronics Co., Ltd.
InventorKouki Nakashima
Life of this patent
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AssigneeYamaichi Electronics Co., Ltd.
InventorKouki Nakashima
Estimating the term…
The test socket includes: a pressing body for pressing an IC package housed in a device housing portion in a direction toward a board; a lid-part main body holding the pressing body while allowing reciprocating movement in the direction toward and from the board, and to be connected to a housing-part main body; a stopper attached at an intermediate point to the lid-part main body so that the stopper is swingable, the stopper having an engaging portion 5a coming into engagement with the housing-part main body, and a proximal end portion approaching and separating from a side surface of the lid-part main body; and an insertion portion to be inserted into a gap between the proximal end portion and the side surface of the lid-part main body according to an action of the pressing body pressing the IC package in the direction toward the board.
A test socket comprising:
Dependencies are inferred from the claim text.