Systems and methods for inspection using electromagnetic radiation

A method for X-ray inspection of a component, the method comprising:

• displaying an image of the component on a touch screen display;
• while the component remains stationary:
• receiving first input at the touch screen display indicating an inspection point on the component;
• calculating, at a controller, a reference point aligned with the inspection point, the reference point having a position at a radius (ρ) on an applicate axis away from the inspection point;
• moving a detector to the reference point, the detector being disposed on a first side of the component;
• moving an emitter on an abscissa axis and an ordinate axis based on the inspection point, the emitter being disposed on a second side of the component opposite the first side;
• receiving second input at the touch screen display indicating a skewed viewing angle of the inspection point;
• calculating, at the controller, a detector position based on the skewed viewing angle, the detector position being located on a curved plane, the curved plane being described by a spherical dome having the radius (ρ) from the inspection point and centered on the reference point;
• and
• moving the detector to the detector position.

A device for inspecting a component, the device comprising of:

• an inspection platform configured to support the component;
• an emitter disposed on a first side of the inspection platform, the emitter configured to emit an inspection beam toward the component;
• a detector disposed on a second side of the inspection platform, opposite the first side, and configured to detect at least a portion of the inspection beam that penetrates the component;
• a detector positioning system operably coupled to the detector and configured to move the detector on an abscissa axis, an ordinate axis, and an applicate axis;
• an emitter positioning system operably coupled to the emitter and configured to move the emitter in the abscissa axis, the ordinate axis, and the applicate axis;
• and
• a controller operably coupled to the emitter positioning system and the detector positioning system, the controller configured to
• receive a first input indicating an inspection point on the component,
• command, via the detector positioning system, the detector to a reference point aligned with the inspection point, the reference point being separated by a radius (ρ) on the applicate axis from the inspection point,
• move the emitter to a point on the abscissa axis and the ordinate axis based on the inspection point,
• receive a second input indicating a modified viewing angle of the inspection point;
• and
• command, via the detector positioning system, the detector to a detector position within a spherical dome centered on the reference point, the spherical dome being defined by an emitter beam width and the radius (ρ),
• wherein the inspection platform and component are stationary.