Method and device for optical surface measurement by means of a chromatic confocal sensor
AssigneeNanoFocus AG
InventorJohannes Frank
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AssigneeNanoFocus AG
InventorJohannes Frank
Estimating the term…
The invention relates to a method and a device for the optical measurement of technical surfaces by means of a chromatic confocal sensor, wherein light from a light source (2) is directed to the surface (5) of a sample to be measured via an optical system (4, 14) with defined chromatic aberration. According to the invention, the light source (2) can be tuned in relation to the wavelength to be emitted. The light reflected back from the sample surface (5) is directed to at least one photosensor (7), wherein the sensor signal is measured over time by means of a detection system (8) and the time of a signal maximum is determined. The detection system (8) derives the height Z of the surface (5) from the wavelength of the light source (2) at the time of the signal maximum.
A method for the optical measurement of technical surfaces by means of a chromatic confocal sensor, wherein light from at least one light source is directed to the surface of a sample to be measured via an optical system with defined chromatic aberration,
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