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US 10,945,690 B2Granted
Scanning X-ray apparatus with full-field detector
AssigneeKoninklijke Philips N.V.
InventorsThomas Koehler, Gerhard Martens, Roland Proksa, Hanns-Ingo Maack, Udo Van Stevendaal, Franz Josef Pfeiffer, Peter Benjamin Theodor Noel, Maximilian Von Teuffenbach
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Abstract
An X-ray imaging apparatus with an interferometer (IF) and an X-ray detector (D). A footprint of the X-ray detector (D) is larger than a footprint of the interferometer (IF). The interferometer is moved in scan motion across the detector (D) whilst the detector (D) remains stationary. Preferably the detector is a 2D full field detector.
Claims15
An X-ray imaging apparatus comprising:
- an X-ray source for emitting a beam of X-ray radiation;
- an X-ray detector arranged opposite said X-ray source across an examination region for accommodating an object to be imaged;
- and
- an interferometer located between the X-ray source and the X-ray detector, wherein the interferometer is arranged at least partly in the beam of X-ray radiation during operation for performing differential phase contrast imaging and/or dark field imaging, the interferometer comprising at least one grating to modulate onto said X-ray radiation an interference pattern detectable by said X-ray detector;
- wherein a footprint of said at least one grating is smaller than a footprint of a radiation sensitive area of said X-ray detector;
- and
- wherein during an imaging operation the apparatus is configured to move said at least one grating in a scanning motion across the X-ray detector whilst said X-ray detector remains stationary relative to the examination region.
4 more elements
Dependencies are inferred from the claim text.