X-ray imaging system and a method of X-ray imaging
AssigneeShenzhen Xpectvision Technology Co., Ltd.
InventorsPeiyan Cao, Yurun Liu
Life of this patent
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Abstract
Disclosed herein is an X-ray imaging system suitable for detecting x-ray, comprising: a first X-ray detector, and a second X-ray detector; wherein the first X-ray detector is configured to move relative to the second X-ray detector; wherein a spatial resolution of the first X-ray detector is higher than a spatial resolution of the second X-ray detector; wherein a detection area of the first X-ray detector is smaller than a detection area of the second X-ray detector. Also described herein is a method of X-ray imaging using the X-ray imaging system.
Claims33
An X-ray imaging system suitable for detecting x-ray, comprising:
- a first X-ray detector, and a second X-ray detector;
- wherein the first X-ray detector is configured to move relative to the second X-ray detector;
- wherein a spatial resolution of the first X-ray detector is higher than a spatial resolution of the second X-ray detector;
- wherein a detection area of the first X-ray detector is smaller than a detection area of the second X-ray detector;
- wherein the first X-ray detector comprises:
- an X-ray absorption layer comprising an electrode;
- a first voltage comparator configured to compare a voltage of the electrode to a first threshold;
- a second voltage comparator configured to compare the voltage to a second threshold;
- a counter configured to register a number of X-ray photons absorbed by the X-ray absorption layer;
- a controller;
- wherein the controller is configured to start a time delay from a time at which the first voltage comparator determines that an absolute value of the voltage equals or exceeds an absolute value of the first threshold;
- wherein the controller is configured to activate the second voltage comparator during the time delay;
- wherein the controller is configured to cause the number registered by the counter to increase by one, if the second voltage comparator determines that an absolute value of the voltage equals or exceeds an absolute value of the second threshold.
A method of X-ray imaging using an X-ray imaging system, wherein the X-ray imaging system comprises:
- a first X-ray detector, and a second X-ray detector;
- wherein the first X-ray detector is configured to move relative to the second X-ray detector;
- wherein a spatial resolution of the first X-ray detector is higher than a spatial resolution of the second X-ray detector;
- wherein a detection area of the first X-ray detector is smaller than a detection area of the second X-ray detector;
- wherein the first X-ray detector comprises:
- an X-ray absorption layer comprising an electrode;
- a first voltage comparator configured to compare a voltage of the electrode to a first threshold;
- a second voltage comparator configured to compare the voltage to a second threshold;
- a counter configured to register a number of X-ray photons absorbed by the X-ray absorption layer;
- a controller;
- wherein the controller is configured to start a time delay from a time at which the first voltage comparator determines that an absolute value of the voltage equals or exceeds an absolute value of the first threshold;
- wherein the controller is configured to activate the second voltage comparator during the time delay;
- wherein the controller is configured to cause the number registered by the counter to increase by one, if the second voltage comparator determines that an absolute value of the voltage equals or exceeds an absolute value of the second threshold;
- the method comprising:
- taking a first image of an object with the second X-ray detector;
- determining an area of interest of the object based on the first image;
- and
- taking a second image of the area of interest with the first X-ray detector.
Dependencies are inferred from the claim text.