US 10,872,708 B2 · Phase contrast X-ray interferometry

Abstract

A phase contrast X-ray imaging system includes: an illumination source adapted to illuminate a region of interest; a diffraction grating adapted to receive illumination from the illuminated region of interest, the diffraction grating comprising a spatial structure having a first periodicity superimposed with a second periodicity that is different from the first periodicity; and a detector adapted to detect illumination passing through the diffraction grating, wherein the spatial structure is defined by varying height and/or pitch, and wherein the spatial structure imparts a first phase dependence based on the first periodicity and an additional phase dependence based on the second periodicity on the illumination passing through the diffraction grating.

Claims13

Dependent claims

A phase contrast X-ray imaging system comprising:

an illumination source adapted to illuminate a region of interest;
a diffraction grating adapted to receive illumination from the illuminated region of interest, the diffraction grating comprising a spatial structure having a first periodicity superimposed with a second periodicity that is different from the first periodicity;
and
a detector adapted to detect illumination passing through the diffraction grating,
wherein the spatial structure is defined by varying height and/or pitch, and
wherein the spatial structure imparts a first phase dependence based on the first periodicity and an additional phase dependence based on the second periodicity on the illumination passing through the diffraction grating.

3 more elements

Dependencies are inferred from the claim text.

Facts

Application

16/044,111Filed 24 Jul 2018 · us provisional application

Priority

24 Jul 2017

Published

US 2019/0027265 A124 Jan 2019

Granted

22 Dec 2020

Term ends

Not estimatedThe source records don’t support an estimate.

Classification6 codes

G21K 1/067
Using diffraction, refraction or reflection, e.g. monochromators: using surface reflection, e.g. grazing incidence mirrors, gratings
G01N 23/041
And forming images of the material: phase-contrast imaging, e.g. using grating interferometers
G21K 1/06
Arrangements for handling particles or ionising radiation, e.g. focusing or moderating: using diffraction, refraction or reflection, e.g.…
G21K 2207/005
Particular details of imaging devices or methods using ionizing electromagnetic radiation such as X-rays or gamma rays: methods and devices…

Phase contrast X-ray interferometry

Life of this patent

Phase contrast X-ray interferometry

Life of this patent

Abstract

Claims13