Method and device for verification

A system for verification, characterized by, the system comprising a calibration object, a first camera device, a second camera device, and a processor;

• the first camera device, for capturing a common two-dimensional image of the calibration object, wherein the calibration object carries a first pattern;
• the second camera device, for capturing an infrared image of the calibration object;
• the processor, for calculating a depth map of the calibration object according to the second camera device;
• and
• the processor, further for calculating, according to the infrared image, coordinates of an image formed on the infrared image by the first pattern, acquiring a depth value of the first pattern according to the depth map, calculating, according to a parameter obtained from calibration, the coordinates of the image formed on the infrared image by the first pattern, and the depth value of the first pattern, a position of a projection formed on the common two-dimensional image by a three-dimensional point cloud corresponding to the image formed on the infrared image by the first pattern, and calculating a distance between an image and the projection formed on the common two-dimensional image by the first pattern;
• or
• calculating, according to the common two-dimensional image, coordinates of an image formed on the common two-dimensional image by the first pattern, acquiring the depth value of the first pattern according to the depth map, calculating, according to a parameter obtained from calibration, the coordinates of the image formed on the common two dimensional image by the first pattern, and the depth value of the first pattern, a position of a projection formed on the infrared image by a three-dimensional point cloud corresponding to the image formed on the common two-dimensional image by the first pattern, and calculating a distance between an image and the projection formed on the infrared image by the first pattern.

A device for verification, characterized by, the device comprising:

• a receiving module, for acquiring a common two-dimensional image, an infrared image and a depth map of a calibration object, wherein the calibration object carries a first pattern;
• and
• a processor, for calculating, according to the infrared image, coordinates of an image formed on the infrared image by the first pattern, acquiring a depth value of the first pattern according to the depth map, calculating, according to a parameter obtained from calibration, the coordinates of the image formed on the infrared image by the first pattern, and the depth value of the first pattern, a position of a projection formed on the common two-dimensional image by a three-dimensional point cloud corresponding to the image formed on the infrared image by the first pattern, and calculating a distance between an image and the projection formed on the common two-dimensional image by the first pattern;
• or
• calculating, according to the common two-dimensional image, coordinates of an image formed on the common two-dimensional image by the first pattern, acquiring a depth value of the first pattern according to the depth map, calculating, according to a parameter obtained from calibration, the coordinates of the image formed on the common two-dimensional image by the first pattern, and the depth value of the first pattern, a position of a projection formed on the infrared image by a three-dimensional point cloud corresponding to the image formed on the common two-dimensional image by the first pattern, and calculating a distance between an image and the projection formed on the infrared image by the first pattern.

A non-transitory computer-readable storage medium, storing a computer program, wherein the computer program is executed by a processor for:

• acquiring a common two-dimensional image, an infrared image and a depth map of a calibration object, wherein the calibration object carries a first pattern;
• and
• (1) according to the infrared image, calculating coordinates of an image formed on the infrared image by the first pattern, (2) according to the depth map, acquiring a depth value of the first pattern, (3) according to a parameter obtained from calibration, the coordinates of the image formed on the infrared image by the first pattern, and the depth value of the first pattern, calculating a position of a projection formed on the common two-dimensional image by a three-dimensional point cloud corresponding to the image formed on the infrared image by the first pattern, and (4) calculating a distance between an image formed on the common two-dimensional image by the first pattern and the projection of the three-dimensional point cloud on the common two-dimensional image;
• or
• (a) according to the common two-dimensional image, calculating coordinates of an image formed on the common two-dimensional image by the first pattern, (b) according to the depth map, acquiring a depth value of the first pattern, (c) calculating a position of a projection formed on the infrared image by a three-dimensional point cloud corresponding to the image formed on the common two-dimensional image by the first pattern, and (d) calculating a distance between an image formed on the infrared image by the first pattern and the projection of the three-dimensional cloud point on the infrared image.

A device for verification, comprising a memory, a processor, and a computer program stored in the memory and operable to be run in the processor, wherein the processor executes the computer program for

• acquiring a common two-dimensional image, an infrared image and a depth map of a calibration object, wherein the calibration object carries a first pattern;
• and
• (1) according to the infrared image, calculating coordinates of an image formed on the infrared image by the first pattern, (2) according to the depth map, acquiring a depth value of the first pattern, (3) according to a parameter obtained from calibration, the coordinates of the image formed on the infrared image by the first pattern, and the depth value of the first pattern, calculating a position of a projection formed on the common two-dimensional image by a three-dimensional point cloud corresponding to the image formed on the infrared image by the first pattern, and (4) calculating a distance between an image formed on the common two-dimensional image by the first pattern and the projection of the three-dimensional point cloud on the common two-dimensional image;
• or
• (a) according to the common two-dimensional image, calculating coordinates of an image formed on the common two-dimensional image by the first pattern, (b) according to the depth map, acquiring a depth value of the first pattern, (c) calculating a position of a projection formed on the infrared image by a three-dimensional point cloud corresponding to the image formed on the common two-dimensional image by the first pattern, and (d) calculating a distance between an image formed on the infrared image by the first pattern and the projection of the three-dimensional cloud point on the infrared image.