Optical system for a projection exposure apparatus
AssigneeCarl Zeiss SMT GmbH
InventorMichael Patra
Life of this patent
Estimating the term…
Loading patent…
AssigneeCarl Zeiss SMT GmbH
InventorMichael Patra
Estimating the term…
An optical system for a microlithographic projection exposure apparatus for operation in the EUV includes a polarization-influencing arrangement having first and one second double reflection surface units, each having first and second reflection surfaces, in each case arranged directly adjacent at a distance d1 and at an angle of 0°±10° relative to one another. The first reflection surface of the first double reflection surface unit and the second reflection surface of the second double reflection surface unit are arranged directly adjacent at a distance d2 and at an angle of 0°±10° relative to one another, with d2>5*d1. Light incident on the first reflection surfaces forms an angle of 43°±10° with the first reflection surfaces. Light incident on the first reflection surface of the first double reflection surface unit is reflected toward the second reflection surface of the second double reflection surface unit.
An optical system, comprising:
Dependencies are inferred from the claim text.