US 10,871,508 B1Granted

Nonlinear transmission line (NLTL)-based miniature reflectometers with reduced heat dissipation and scalable tether length

AssigneeAnritsu Corporation

InventorsThomas Roberts, Karam Noujeim

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Abstract

A system for measuring an electrical response of a device under test (DUT) includes a reflectometer with reduced heat dissipation used with a vector network analyzer (VNA). The reflectometer is tethered to the VNA using a tether of scalable length which carries low frequencies. The reflectometer has a distributed harmonic generator including a non-linear transmission line (NLTL) for multiplying a frequency of an RF signal received from the VNA to generate a test signal having a frequency in the millimeter wave range at a test port connected to the DUT. A sampler in the reflectometer receives a local oscillator (LO) signal from the VNA and includes another NLTL for receiving the LO signal and generating pulses at a frequency in the millimeter wave range. When the test signal is transmitted to the DUT, the sampler outputs intermediate frequency signals which are transmitted to the VNA for characterization of the DUT.

Claims15

Dependent claims

A system comprising a reflectometer, for measuring an electrical response of a device under test (DUT), the reflectometer module comprising:

an input port for connecting the reflectometer module via a tether to a radio frequency (RF) source and receiving a radio frequency (RF) signal;
a test port for connecting the reflectometer to a device under test (DUT);
a distributed harmonic generator connected to the input port, wherein the RF signal from the input drives the distributed harmonic generator to multiply the RF signal and generate a test signal having a frequency in the millimeter wave range;
an amplifier connected to the distributed harmonic generator and configured to amplify the test signal generated by the distributed harmonic generator;
a signal path connecting the amplifier to the output port, wherein the amplifier provides the amplified test signal through the signal path to the output port;
a sampler coupled to the signal path, wherein the sampler comprises,
a sampler input connectable with an local oscillator (LO) source to receive a LO signal,
a non-linear transmission line (NLTL) for receiving the LO signal and generating pulses at a frequency in the millimeter wave range,
wherein the sampler is configured to receive an input signal from the DUT in response to the test signal, wherein the response signal is in the millimeter wave range,
wherein the sampler is configured to generate an intermediate frequency (IF) signal from the response signal using the pulse generated by the NLTL, and
wherein the sampler outputs the IF an signal via the tether to a receiver of a measuring instrument.

8 more elements

A system for measuring an electrical response of a device under test (DUT), comprising:

a vector network analyzer (VNA) having a radio frequency source, a receiver, and a port for transmitting RF signal;
a reflectometer module with reduced heat dissipation, the reflectometer module being connectable with the VNA and including
an input port for connecting the reflectometer module via a tether to the radio frequency (RF) source and receiving the radio frequency (RF) signal from the VNA,
a test port for connecting the reflectometer module to the DUT,
a distributed harmonic generator connected to the input port, wherein the RF signal from the input drives the distributed harmonic generator to multiply the RF signal and generate a test signal having a frequency in the millimeter wave range,
an amplifier connected to the distributed harmonic generator and configured to amplify the test signal generated by the distributed harmonic generator,
a signal path connecting the amplifier to the output port, wherein the amplifier provides the amplified test signal through the signal path to the output port,
a sampler coupled to the signal path, wherein the sampler comprises,
a sampler input connectable with an local oscillator (LO) source to receive a LO signal,
a non-linear transmission line (NLTL) for receiving the LO signal and generating pulses at a frequency in the millimeter wave range,
wherein the sampler is configured to receive an input signal from the DUT in response to the test signal, wherein the response signal is in the millimeter wave range,
wherein the sampler is configured to generate an intermediate frequency (IF) signal from the response signal using the pulse generated by the NLTL, and
wherein the sampler outputs the IF signal via the tether to the receiver of the VNA;
a tether for connecting the reflectometer module to the VNA via the port to carry the LO signal and the RF signal from the VNA to the reflectometer module and the IF signal from the reflectometer module to the VNA.

11 more elements

A system for measuring an electrical response of a device under test (DUT), comprising:

a vector network analyzer (VNA) having a radio frequency source, a LO source for transmitting a LO signal, a receiver, and a port for transmitting an RF signal;
a reflectometer module;
a tether which connects the reflectometer module to the VNA to carry the LO signal and the RF signal from the VNA to the reflectometer module and an IF signal from the reflectometer module to the VNA;
wherein the reflectometer module comprises,
an input port for connecting the reflectometer module via a tether to the radio frequency (RF) source and receiving the radio frequency (RF) signal from the VNA,
a test port for connecting the reflectometer module to the DUT,
a distributed harmonic generator connected to the input port, wherein the RF signal from the input drives the distributed harmonic generator to multiply the RF signal and generate a test signal having a frequency in the millimeter wave range,
an amplifier connected to the distributed harmonic generator and configured to amplify the test signal generated by the distributed harmonic generator,
a signal path connecting the amplifier to the output port, wherein the amplifier provides the amplified test signal through the signal path to the output port,
a sampler coupled to the signal path, wherein the sampler comprises,
a sampler input connectable with an local oscillator (LO) source to receive a LO signal,
a non-linear transmission line (NLTL) for receiving the LO signal and generating pulses at a frequency in the millimeter wave range,
wherein the sampler is configured to receive an input signal from the DUT in response to the test signal, wherein the response signal is in the millimeter wave range,
wherein the sampler is configured to generate an intermediate frequency (IF) signal from the response signal using the pulse generated by the NLTL, and
wherein the sampler outputs the IF signal via the tether to the receiver of the VNA.

12 more elements

Dependencies are inferred from the claim text.

Facts

Application: 16/024,788Filed 30 Jun 2018 · us provisional application
Priority: 30 Jun 2017
Granted: 22 Dec 2020
Term ends: Not estimatedThe source records don’t support an estimate.

Classification6 codes

G01R 1/24
Modifications of basic electric elements for use in electric measuring instruments; Structural combinations of such elements with such…
G01R 27/28
Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom: measuring attenuation, gain, phase…
G01R 1/0416
Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets: connectors, terminals
G01R 23/20
Spectrum analysis; Fourier analysis: measurement of non-linear distortion

Family

Application62/527,954Us provisional application · filed 30 Jun 2017
US 10,871,508 B1This patent

From the US filing history. Foreign family members aren’t listed.

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