Measurement device, electronic apparatus and measurement method
AssigneeSeiko Epson Corporation
InventorHideaki Kasahara
Life of this patent
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AssigneeSeiko Epson Corporation
InventorHideaki Kasahara
Estimating the term…
A measurement device includes a plurality of light sources configured to emit light toward a measurement object, and having a same emission spectrum, a spectroscopic measurement section configured to perform spectroscopic measurement on the light reflected by the measurement object, a light source switching section configured to switch a combination of the light sources to be put on or off out of the plurality of light sources, and an arithmetic section configured to calculate the spectral reflectivity of the measurement object based on a spectroscopic measurement result obtained by the spectroscopic measurement section when putting on or off the plurality of light sources with a plurality of the combinations.
A measurement device comprising:
A measurement method of a measurement device including
Dependencies are inferred from the claim text.