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US 10,871,398 B2Granted
Gas analyzer
AssigneeYokogawa Electric Corporation
InventorsYoshitaka Kobayashi, Junichi Matsuo
Life of this patent
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Abstract
A gas analyzer includes an optical emitter that irradiates measurement light into a measurement region including a gas to be measured; a reflector that reflects the measurement light irradiated from the optical emitter; an optical receiver that receives the measurement light reflected by the reflector; and an aligner that expands a beam diameter of the measurement light at the reflector.
Claims6
A gas analyzer comprising:
- an optical emitter that irradiates measurement light into a measurement region including a gas to be measured;
- a probe that extends along an optical axis of the measurement light so as to overlap the measurement region inside the probe;
- a reflector that reflects the measurement light irradiated from the optical emitter and that is positioned at an opposite side of the probe from the optical emitter;
- an optical receiver that receives the measurement light reflected by the reflector;
- and
- an aligner that expands a beam diameter of the measurement light at the reflector to a value at which the measurement light includes the reflector, wherein the value is based on a length of the probe and an amount of the measurement light that the optical receiver needs to receive for analysis of the measurement light.
3 more elements
Dependencies are inferred from the claim text.