Encapsulation film
AssigneeLG Chem, Ltd.
InventorsHyun Suk Kim, Hyun Jee Yoo, Jung Ok Moon, Jung Woo Lee, Se Woo Yang
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AssigneeLG Chem, Ltd.
InventorsHyun Suk Kim, Hyun Jee Yoo, Jung Ok Moon, Jung Woo Lee, Se Woo Yang
Estimating the term…
The present application relates to an encapsulating film, a reliability assessment therefor, an organic electronic apparatus comprising the encapsulating film, and a method for producing an organic electronic apparatus which has used the encapsulating film, and provides: a reliability assessment method which can predict the reliability of the encapsulating film before same is applied to the organic electronic apparatus, the encapsulating film blocking moisture or oxygen from the outside entering the organic electronic apparatus; and the encapsulating film which can block moisture with high reliability.
A method of evaluating reliability of an encapsulation film comprising:
An encapsulation film comprising a metal layer, and an encapsulation layer formed on said metal layer and comprising a moisture adsorbent, and having a specular reflectance R, according to Equation 1 below to the encapsulation layer formed on said metal layer at a wavelength of 550 nm, of 6.5 or less:
Dependencies are inferred from the claim text.