Test board

Abstract

The present disclosure relates to an electronic device. A test board having improved reliability according to the present disclosure includes a main board, a storage device connector positioned at an upper section of the main board and configured to vertically combine the main board and a storage device with each other, an analysis signal output terminal positioned at the upper section of the main board and configured to output an analysis signal for testing the storage device or communication between the storage device and a host, a host connector connected to a first side section of the main board and configured to combine the main board and the host with each other; and a first sub board detachably connected to a second side section of the main board.

Dependencies are inferred from the claim text.