Learning based incident or defect resolution, and test generation
AssigneeAccenture Global Solutions Limited
InventorsJanardan Misra, Divya Rawat, Shubhashis Sengupta
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AssigneeAccenture Global Solutions Limited
InventorsJanardan Misra, Divya Rawat, Shubhashis Sengupta
Estimating the term…
In some examples, learning based incident or defect resolution, and test generation may include ascertaining historical log data that includes incident or defect log data associated with operation of a process, and generating, based on the historical log data, step action graphs. Based on grouping of the step action graphs with respect to different incident and defect tickets, an incident and defect action graph may be generated to further generate a machine learning model. Based on an analysis of the machine learning model with respect to a new incident or defect, an output that includes a sequence of actions may be generated to reproduce, for the new incident, steps that result in the new incident, reproduce, for the new defect, an error that results in the new defect, identify a root cause of the new incident or defect, and/or resolve the new incident or defect.
A learning based incident or defect resolution, and test generation apparatus comprising:
A computer implemented method for learning based incident or defect resolution, and test generation comprising:
A non-transitory computer readable medium having stored thereon machine readable instructions, the machine readable instructions, when executed by at least one hardware processor, cause the at least one hardware processor to:
Dependencies are inferred from the claim text.