Method for manufacturing piezoelectric thin-film element
AssigneesPiezo Studio Inc., Tohoku University
InventorsKenji Inoue, Akira Yoshikawa, Yuji Ohashi, Yuui Yokota, Kei Kamada, Shunsuke Kurosawa
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AssigneesPiezo Studio Inc., Tohoku University
InventorsKenji Inoue, Akira Yoshikawa, Yuji Ohashi, Yuui Yokota, Kei Kamada, Shunsuke Kurosawa
Estimating the term…
To improve the Q value of a piezoelectric thin-film element in a state in which unnecessary vibration is suppressed, an acoustic reflection film (104) is affixed to a first electrode (102), a piezoelectric single-crystal substrate (101) is thinned by polishing from the other surface (101b) of the piezoelectric single-crystal substrate (101), such that the first electrode (102) and piezoelectric thin film (105) are piled on the piezoelectric single-crystal substrate (101). In this polishing, a pressure (polishing pressure) to the surface (101b) during polishing in an electrode formation region where the first electrode (102) is formed differs from that in a non-electrode formation region around the electrode formation region. Consequently, the electrode formation region of the piezoelectric thin film (105), where the first electrode (102) is formed, is made thinner than the non-electrode formation region around the electrode formation region.
A method of manufacturing a piezoelectric thin-film element, comprising:
A method of manufacturing a piezoelectric thin-film element, comprising:
Dependencies are inferred from the claim text.