Apparatus and methods for electrical overstress protection
AssigneeSkyworks Solutions, Inc.
InventorLeslie Paul Wallis
Life of this patent
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AssigneeSkyworks Solutions, Inc.
InventorLeslie Paul Wallis
Estimating the term…
Apparatus and methods for electrical overstress (EOS) protection circuits are provided herein. In certain configurations, an EOS protection circuit includes an overstress sensing circuit electrically connected between a pad and a first supply node, an impedance element electrically connected between the pad and a signal node, a controllable clamp electrically connected between the signal node and the first supply node and selectively activatable by the overstress sensing circuit, and an overshoot limiting circuit electrically connected between the signal node and a second supply node. The overstress sensing circuit activates the controllable clamp when an EOS event is detected at the pad. Thus, the EOS protection circuit is arranged to divert charge associated with the EOS event away from the signal node to provide EOS protection.
An integrated circuit with electrical overstress protection, the integrated circuit comprising:
An overstress protection circuit for a semiconductor chip, the overstress protection circuit comprising:
A method of providing overstress protection, the method comprising:
The method of 18 wherein activating the controllable clamp includes mirroring a current flowing through the overstress sensing circuit.
The method of 18 wherein protecting the signal node from overshoot includes forward biasing at least one diode.
Dependencies are inferred from the claim text.