Silicon member and method of producing the same
AssigneeMitsubishi Materials Corporation
InventorYoshinobu Nakada
Life of this patent
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Abstract
A silicon member and a method of producing the silicon member are provided. Cracking is suppressed in the silicon member even if the silicon member is used in a condition where it is heated. The silicon member 10 includes a coating layer 11 that coats a surface of the silicon member 10, wherein the coating layer 11 is composed of a product of silicon formed by reaction of the silicon on the surface, and a thickness of the coating layer is 15 nm or more and 600 nm or less. It is preferable that the coating layer is a silicon oxide film or a silicon nitride film.
Claims6
A method of producing a holding plate for a liquid crystal panel in deposition and heat treatment that is used in a condition where the holding plate is heated at a temperature ranged from 300°C. to 1100°C., the method comprising steps of:
- excising a large-sized plate material made of a poly-crystalline silicon or a pseudosingle-crystalline silicon from a unidirectionally solidified columnar crystal ingot;
- forming a coating layer composed of a product of silicon formed by reaction of the silicon on a surface of the large-sized plate material which has micro-cracks on the surface before forming the coating layer, wherein
- the large-sized plate material has the dimension:
- width W being 500 mm to 1500 mm;
- length L being 500 mm to 1500 mm;
- and thickness H being 5 mm to 50 mm,
- the step of forming the coating layer comprises the steps of:
- forming a silicon oxide film on the surface of the large-sized plate material in a furnace by pyrogenic oxidation;
- removing the silicon oxide film from the large-sized plate material using a buffered hydrofluoric acid solution;
- and
- forming a silicon nitride film on the surface of the large-sized plate material as the coating layer while flowing ammonia into the furnace;
- wherein
- a thickness of the coating layer, t10, is 15 nm or more and 50 nm or less, and after forming the coating layer,
- the surface of the holding plate is free of scratches and micro-cracks,
- a maximum load in four-point bending of the holding plate is between 188-265 MPa, and
- a penetration depth, t11, of the silicon nitride film into silicon on the surface toward an internal side of the large-sized plate material satisfies a formula t11≥0.88×t10 based on densities and molecular weights of Si and Si3N4, t10 and t11 being measured with a spectroscopic ellipsometer.
A method of producing a holding plate comprising steps of:
- excising a large-sized plate material made of a poly-crystalline silicon or a pseudosingle-crystalline silicon from a unidirectionally solidified columnar crystal ingot;
- forming a coating layer composed of a product of silicon formed by reaction of the silicon on a surface of the large-sized plate material which has micro-cracks on the surface before forming the coating layer, wherein
- the large-sized plate material has the dimension:
- width W being 500 mm to 1500 mm;
- length L being 500 mm to 1500 mm;
- and thickness H being 5 mm to 50 mm,
- the step of forming the coating layer comprises the steps of:
- forming a silicon oxide film on the surface of the large-sized plate material in a furnace by pyrogenic oxidation;
- removing the silicon oxide film from the large-sized plate material using a buffered hydrofluoric acid solution;
- and
- forming a silicon nitride film on the surface of the large-sized plate material as the coating layer while flowing ammonia into the furnace.
Dependencies are inferred from the claim text.