Nonvolatile memory device and operating method of the same
AssigneeSamsung Electronics Co., Ltd.
InventorsWon-Taeck Jung, So-Yeong Gwak, Sang-Wan Nam
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Abstract
An operation method of a nonvolatile memory device includes applying a program voltage to a selected word line and programming a selected memory cell connected to the selected word line; reading an adjacent memory cell connected to an adjacent word line of the selected word line; and verifying the selected memory cell by adjusting charge sharing between the selected memory cell and a sensing node, which is connected to the selected memory cell through a bit line.
Claims20
An operation method executed by a nonvolatile memory device, the method comprising:
- applying a programming voltage to a selected word line and programming a selected memory cell that is connected to the selected word line;
- reading an adjacent memory cell that is connected to an adjacent word line of the selected word line;
- and
- verifying the selected memory cell by adjusting charge sharing between the selected memory cell and a sensing node, which is connected to the selected memory cell through a bit line, based on a result of reading the adjacent memory cell.
A nonvolatile memory device comprising:
- a memory cell array comprising a plurality of flash memory cells connected to a plurality of bit lines;
- a row decoder configured to be connected by a plurality of word lines, a string selection line, and a ground selection line;
- a page buffer configured to transfer a bit line voltage on the plurality of bit lines and detect data stored in the flash memory cells through at least one bit line among the plurality of bit lines;
- and
- a control logic performing verification on a selected memory cell by reading an adjacent word line of a selected word line addressing the selected memory cell and adjusting charge sharing between the selected memory cell and a sensing node, which is connected to the selected memory cell through the at least one bit line, based on a result of reading the adjacent word line, wherein:
- the control logic changes a sensing time based on a result of reading the adjacent word line, and
- the sensing time is a time that a bit line sensing signal is applied to control charge sharing of the sensing node.
A method executed by a nonvolatile memory device, the method comprising:
- programming a selected memory cell addressed by a selected word line;
- reading an adjacent memory cell addressed by an adjacent word line, which is adjacent to the selected word line, to determine a program state of the adjacent memory cell;
- determining, based upon the program state, whether to apply a first verification operation or a second verification operation, which differs from the first verification operation, as a selected verification operation;
- and
- applying the selected verification operation to the selected memory cell for determining whether the selected memory cell is programmed to a predetermined program state.
Dependencies are inferred from the claim text.