US 10,768,232 B2 · ATE compatible high-efficient functional test

Abstract

A method, computer program product and/or system is disclosed. According to an aspect of this invention, a device under test (DUT) is switched to a functional test mode. In some embodiments of the present invention, the DUT receives a general scan design (GSD) pattern while in the functional test mode. In some embodiments, the DUT executes a first functional test corresponding to the GSD pattern. In yet other embodiments, the DUT further comprises a state machine that controls the execution of the first functional test. The DUT may further store the output address, the output data, and the status to an address register, a data register, and a status register, respectively and/or send the output address, the output data, and the status to an address register to an automatic testing equipment (ATE).

Claims17

Dependent claims

A method, comprising:

switching a device under test (DUT) to a functional test mode;
receiving, by the DUT, via a scan-in pin of a parallel scan design interface, a scan design pattern;
translating, by the DUT, the received scan design pattern into a first functional test, the first functional test having a first functional command, the received scan design pattern identifying of a part of the DUT to be tested by referencing an address register, and the received scan design pattern identifying data to be used by the first functional command as input by referencing a data register;
executing, by the DUT, the first functional test, wherein a state machine controls the execution of the first functional test;
and
sending, by the DUT, via a scan-out pin of the parallel scan design interface, output data corresponding to the first functional test to an automatic test equipment.

3 more elements

A computer program product comprising:

one or more computer readable storage media;
and
program instructions stored on the one or more computer readable storage media, the stored program instructions comprising:
program instructions to switch a device under test (DUT) to a functional test mode;
program instructions to receive, via a scan-in pin of a parallel scan design interface, a scan design pattern;
program instructions to translate the received scan design pattern into a first functional test, the first functional test having a first functional command, the received scan design pattern identifying of a part of the DUT to be tested by referencing an address register, and the received scan design pattern identifying data to be used by the first functional command as input by referencing a data register;
program instructions to execute the first functional test, wherein a state machine controls the execution of the first functional test;
and
program instructions to send, via a scan-out pin of the parallel scan design interface, output data corresponding to the first functional test to an automatic test equipment.

6 more elements

A computer system comprising:

one or more computer processors;
one or more computer readable media;
and
program instructions, stored on the one or more computer readable media for execution by at least one of the one or more processors, the stored program instructions comprising:
program instructions to switch a device under test (DUT) to a functional test mode;
program instructions to receive, via a scan-in pin of a parallel scan design interface, a scan design pattern;
program instructions to translate the received scan design pattern into a first functional test, the first functional test having a first functional command, the received scan design pattern identifying of a part of the DUT to be tested by referencing an address register, and the received scan design pattern identifying data to be used by the first functional command as input by referencing a data register;
program instructions to execute the first functional test, wherein a state machine controls the execution of the first functional test;
and
program instructions to send, via a scan-out pin of the parallel scan design interface, output data corresponding to the first functional test to an automatic test equipment.

7 more elements

Dependencies are inferred from the claim text.

ATE compatible high-efficient functional test

Life of this patent

ATE compatible high-efficient functional test

Life of this patent

Abstract

Claims17