US 10,768,219 B2Granted

Method and apparatus for flexure testing of electronic components

AssigneeDISH Network L.L.C.

InventorsKirk Lenzie, Jamie Metzger, Kenneth Jones, Matthew Bailey

Life of this patent

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Abstract

Disclosed herein is a method and apparatus for testing the response of electrical circuits to being flexed. Support members, preferably at least two, are positioned to receive the electrical circuits to be tested. The support members are spaced apart from each other to permit the electrical circuit to be flexed between the two support members. A plunger, having an arcuate front face is positioned between the support members. The plunger is depressed, flexing the electrical circuit a selected amount. After the circuit has been flexed a selected amount, the circuit is tested to determine whether or not it is fully operational after being flexed.

Claims17

Dependent claims

A method of operational integrity testing a plurality of electronic components comprising:

placing a plurality of electronic components at respective, selected locations on a printed circuit board, each of the electronic components being spaced from each other;
placing the printed circuit board in a flexure test fixture;
pressing a plunger into the printed circuit board, the plunger having a surface area approximately equal to the surface area of the printed circuit board and contacting the printed circuit board at multiple locations, the plunger further including a single arcuate face surface and a stop member;
continuing to press the plunger into the printed circuit board to cause the printed circuit board to flex until the printed circuit board reaches a selected bent position and the stop member halts further movement of the plunger;
and
testing the operational integrity of the electric components after the plunger has moved a selected distance, wherein if the electric components are fully electrically functional after the plunger has moved the selected distance, then the electric components are determined to have passed the test.

3 more elements

Dependencies are inferred from the claim text.

Facts

Application: 16/013,575Filed 20 Jun 2018
Published: US 2019/0391200 A126 Dec 2019
Granted: 8 Sep 2020
Term ends: Not estimatedThe source records don’t support an estimate.

Classification16 codes

G01R 31/2808
Apparatus therefor, e.g. test stations, drivers, analysers, conveyors: holding, conveying or contacting devices, e.g. test adapters, edge…
G01R 31/2817
Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing: environmental-, stress-, or burn-in tests
H05K 1/0268
Marks, test patterns or identification means: for electrical inspection or testing
H05K 1/189
Structurally associated with non-printed electric components: characterised by the use of flexible or folded printed circuits

Family

US 2019/0391200 A1Pre-grant publication · published 26 Dec 2019
US 10,768,219 B2This patent

From the US filing history. Foreign family members aren’t listed.

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