US 10,768,215 B2Granted

Method of measuring the AM/PM conversion of a device under test

AssigneeRohde & Schwarz GmbH & Co. KG

InventorsMartin Leibfritz, Werner Held, Thilo Bednorz, Walter Weiss, Jan-Patrick Schultheis

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Abstract

A method of measuring the AM/PM conversion of a device under test having a local oscillator is described. A device under test with an embedded local oscillator is provided. A signal source is connected to an input of the device under test. A receiver is connected to an output of the device under test. An input signal is provided by the signal source. The input signal has an initial power level. The input signal is input to the device under test. The power level of the input signal is changed. An output signal of the device under test is measured at different power levels of the input signal.

Claims20

Dependent claims

A method of measuring the AM/PM conversion of a device under test having a local oscillator, with the following steps:

providing a device under test with an embedded local oscillator,
connecting a signal source to an input of said device under test,
connecting a receiver to an output of said device under test,
providing an input signal by said signal source, said input signal having an initial power level, said input signal being input to said device under test,
changing the power level of said input signal, and
measuring an output signal of said device under test at different power levels of said input signal, wherein the power level of a certain measurement is lower than the power level of a previous measurement and lower than the power level of a subsequent measurement.

3 more elements

Dependencies are inferred from the claim text.