US 10,768,214 B2Granted

Multi-view planar near-field scattering tomography system

AssigneeOZ Optics Ltd.

InventorsSafieddin Safavi-Naeini, Shahed Shahir

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Abstract

A multi-view planar near-field scattering tomography system is provided herein. In one aspect the system is developed based on the reformulated signal subspace approach. Utilized for solving the electromagnetic inverse scattering problem, the signal subspace approach is reformulated. The present invention pertains to a computationally efficient approach to an electromagnetic inverse scattering-based permittivity profile estimation technique. In a second aspect, the system is developed at the millimeter-wave and THz frequency range to ensure accuracy by eliminating the multipath effects and without the need for an Anechoic chamber or water as a background medium for clinical, security, and manufacturing applications.

Claims2

Dependent claims

A method of estimating the permittivity profile using data collected at observation points comprising the steps of:

(a) measuring incident electric fields over the observation points in the absence of any scatterers;
(b) illuminating a scatterer from different angles;
(c) measuring total electric fields at the observation points for different angles in the presence of the scatterer for a full revolution;
(d) calculating a radiating volume equivalent current source (VECS), a radiating total internal electric field, and a radiating contrast factor of the scatterer for each incident angle;
(e) determining an expected contrast factor and localizing boundaries of the scatterer;
(f) estimating the permittivity profile of OUT;
and
(g) determining the conductivity profile of OUT utilizing the following equation:
κ
r
=
ϵ
r
-
1
-
j
⁢
σ
ω
⁢
⁢
ϵ
0
,
ϵr, ϵ0, ω, and σ are relative permittivity, free space permittivity, angular frequency, and conductivity respectively.

23 more elements

Dependencies are inferred from the claim text.

Facts

Application: 15/699,051Filed 8 Sep 2017
Priority: CA 29414879 Sep 2016
Published: US 2018/0074103 A115 Mar 2018
Granted: 8 Sep 2020
Term ends: Not estimatedThe source records don’t support an estimate.

Classification6 codes

G01R 27/32
Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient…:…
G01N 22/00
Investigating or analysing materials by the use of microwaves or radio waves
G01R 27/06
In circuits having distributed constants , e.g. having very long conductors or involving high frequencies: measuring reflection coefficients;…
G01R 29/0821
Field measurements related to measuring influence on or from apparatus, components or humans , e.g. in ESD, EMI, EMC, EMP testing, measuring…:…

Family

US 2018/0074103 A1Pre-grant publication · published 15 Mar 2018
US 10,768,214 B2This patent

From the US filing history. Foreign family members aren’t listed.

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