Conductive test probe

A conductive probe, comprising:

• a probe body made from a material of relatively low electrical resistivity, comprised of a conductor;
• a probe tip coupled with the probe body, the probe tip comprising a gold plating and featuring blunt or rounded terminal end;
• the probe tip comprising a cylindrically shaped buried end and including a conical shape narrowing to a narrowed end, wherein the buried end of the probe tip comprises a buried end width that extends into an interior of the probe body, the buried end width ranging between 0.0001 to 0.005 inches;
• a butted connection configured between the probe tip and probe body to define an axial path;
• wherein the narrow end comprises a sharpened end terminating in a point and configured to make reliable contact with a circuit node;
• a probe plug configured to couple the probe body with a circuit tester or a jumper using a threaded attachment;
• wherein the probe body is configured to conduct an electrical current when engaged by a user using an actuating button, between the probe plug and the probe tip mounted to an end of probe body, resulting in lines of uniform current density at the probe tip, while retrieving and displaying measured electrical parameters;
• and
• wherein the distance between a contact surface and the portion of the probe body nearest the contract surface is less than 0.250 inches.