Surface defect inspection device and method
AssigneeKonica Minolta, Inc.
InventorsKoji Harada, Masato Kashihara, Taizo Wakimura
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AssigneeKonica Minolta, Inc.
InventorsKoji Harada, Masato Kashihara, Taizo Wakimura
Estimating the term…
According to a surface defect inspection device and a surface defect inspection method according to the present invention, an inspection face of an inspection object is irradiated with illumination light, and a defect at the inspection face is detected, based on an image including the inspection face captured. According to the surface defect inspection device and the surface defect inspection method, the illumination light is emitted with formation of at least one set of a light region and a dark region, and a range of a defect detection image region for the detection of the defect, to be set to the image capturing the inspection face irradiated with the illumination light in the light region, is adjusted in accordance with a previously defined degree of visibility for orange peel, at the detection of the defect at the inspection face.
A surface defect inspection device that irradiates an inspection face of an inspection object with illumination light, and detects a defect at the inspection face, based on an image including the inspection face captured, the surface defect inspection device comprising:
A surface defect inspection method including irradiating an inspection face of an inspection object with illumination light, and detecting a defect at the inspection face, based on an image including the inspection face captured, the surface defect inspection method comprising:
Dependencies are inferred from the claim text.