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US 10,768,115 B2Granted
Augmented Raman analysis of a gas mixture
AssigneeKaiser Optical Systems
InventorsJoseph B. Slater, James M. Tedesco, Francis Esmonde-White
Life of this patent
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Abstract
The present disclosure includes discloses a method for analyzing a multi-component gas sample using spectroscopy in combination with the measurement of extrinsic or intrinsic properties of the gas sample. The results of the spectroscopic analysis and the measurement are combined to quantify a gas component unseen by the spectroscopic analysis.
Claims8
A method for analyzing the composition of a multi-component matter sample comprising:
- determining a first composition of a multi-component matter sample using a spectroscopic device;
- calculating a relative composition matrix containing a normalized molar amount of each component of the matter sample, based on the first composition;
- calculating a value of a first secondary property of the matter sample using the relative composition matrix;
- measuring a value of the first secondary property of the matter sample with a sensor embodied to measure the value of the first secondary property;
- and
- determining whether a first difference between the calculated value of the first secondary property and the measured value of the first secondary property exceeds a first threshold,
- wherein upon determining that the first difference exceeds the first threshold:
- attributing the first difference to a component invisible to the spectroscopic device;
- calculating a first amount of the spectroscopic-invisible component using the first difference;
- adding the first amount of the spectroscopic-invisible component to the relative composition matrix;
- and
- adjusting the normalized molar amount of each component in the relative composition matrix to account for the first amount of the spectroscopic-invisible component.
9 more elements
Dependencies are inferred from the claim text.