Semiconductor device
AssigneeMitsubishi Electric Corporation
InventorsKazuya Okada, Hiroki Muraoka, Koichi Masuda, Yasutaka Shimizu, Shoji Izumi
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AssigneeMitsubishi Electric Corporation
InventorsKazuya Okada, Hiroki Muraoka, Koichi Masuda, Yasutaka Shimizu, Shoji Izumi
Estimating the term…
Provided is a technique for improving product attachment. In a semiconductor device, the following expression is satisfied by an angle A formed by an imaginary line connecting two attachment holes together and an imaginary line connecting together a lowest point of one of two projections positioned in a surrounding portion of one of the two attachment holes and a contact point between a bulge and a heat sink, with a screw fastened to the heat sink through the one attachment hole, where M represents a vertical direction between the lower end of a body and the lower end of a case, where W represents a bulge amount of the bulge, where T represents a height of the projection, where L represents a horizontal distance from the outer peripheral end of the case to the outer peripheral end of the heat dissipation plate: 0<A<arctan((M+W−T)/L).
A semiconductor device comprising:
Dependencies are inferred from the claim text.