Method and apparatus for detecting and removing defective integrated circuit packages

An integrated circuit (IC) package production device for performing at least one procedure in the production of IC packages on a plurality of leadframe units, the leadframe units being affixed to a leadframe strip, the leadframe strip having strip identifying indicia located therein, the device comprising:

• a reader operable to read the strip identifying indicia affixed to the leadframe strip;
• a mechanism operable to perform at least one production procedure on the plurality of leadframe units;
• and
• a processor operable to correlate the identification of the leadframe strip to a database that identifies locations of leadframe units on the leadframe strip, and operable to update the database to identify locations of leadframe units on which the at least one production procedure was performed.

An integrated circuit (IC) test station for testing a plurality of leadframe units affixed to a leadframe strip, the leadframe strip having identification indicia located thereon, the station comprising:

• a reader operable to read the identification indicia affixed to the leadframe strip;
• a testing device operable to test the plurality of leadframe units;
• and
• a processor operable to correlate the identification of the leadframe strip to a database that identifies locations of leadframe units on the leadframe strip, and operable to update the database to identify locations of leadframe units in response to the testing performed by the testing device.

A method for making integrated circuit (IC) packages, the method comprising:

• providing a leadframe strip having a plurality of leadframe units;
• providing the leadframe strip to an operating station that is operable to perform at least one test on the plurality of leadframe units in the making of IC packages;
• obtaining a database having the locations of leadframe units in the leadframe strip stored therein;
• performing the at least one test on the plurality of leadframe units;
• updating the database in response to the results of the at least one test;
• and
• marking the leadframe strip with identifying indicia.