Impurity diffusion agent composition and method for manufacturing semiconductor substrate
AssigneeTokyo Ohka Kogyo Co., Ltd.
InventorsYoshihiro Sawada, Yu Takahashi
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Abstract
A diffusion agent composition that can be evenly applied onto the whole area of an inner surface of the fine voids, whereby boron can be well and uniformly diffused into the semiconductor substrate even by heating at a low temperature, and a method for manufacturing a semiconductor substrate using the diffusion agent composition. In a diffusion agent composition including an impurity diffusion component, the impurity diffusion component, which can be applied onto a surface of a semiconductor substrate to form a diffusion layer, and which is a boron compound including a nitrogen atom, is used.
Claims8
A diffusion agent composition used for diffusion of impurities into a semiconductor substrate, comprising an impurity diffusion component (A) which can be applied onto a surface of a semiconductor substrate to form a diffusion layer, and
- an organic solvent (S),
- wherein said impurity diffusion component (A) is a boron compound including a nitrogen atom, and
- wherein the boron compound is a compound represented by the following formula (a1) or the following formula (a2):
- wherein R1, R2, R3, and R4 each independently represents a hydrogen atom, a hydroxyl group, an organic group which does not contain a nitrogen atom, or a nitrogen atom-containing group;
- at least one of R1, R2, R3, and R4 is a nitrogen atom-containing group;
- and R1 and R2, R2 and R4, R3 and R4, as well as R1 and R3, may each independently be bonded to each other to form a ring, and in the formula (a2), R5, R6, and R7 each independently represents a hydrogen atom, a hydroxyl group, an organic group which does not contain a nitrogen atom, or a nitrogen atom-containing group;
- at least one of R5, R6, and R7 is a nitrogen atom-containing group;
- and two of R5, R6, and R7 may be bonded to each other to form a ring.
Dependencies are inferred from the claim text.