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US 10,504,723 B2Granted
Method and apparatus for selective epitaxy
AssigneeApplied Materials, Inc.
InventorsXuebin Li, Hua Chung, Flora Fong-Song Chang, Schubert S. Chu, Abhishek Dube
Life of this patent
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Abstract
A method of forming a film on a substrate having silicon surfaces and dielectric surfaces includes precleaning the substrate; applying an inhibitor species to the dielectric surfaces; and exposing the substrate to a precursor while maintaining a temperature of less than about 600 degrees Celsius.
Claims12
A method of forming a film on a substrate, the method comprising:
- precleaning a substrate, wherein a surface of the substrate comprises silicon surfaces and dielectric surfaces;
- applying an inhibitor species to the surface of the substrate in a first processing chamber such that the inhibitor species preferentially attaches to the dielectric surfaces of the surface of the substrate;
- exposing the substrate having the inhibitor species on the dielectric surfaces thereof to a precursor for epitaxial deposition of a silicon- or germanium- containing layer in a second processing chamber, different than the first processing chamber, while maintaining the substrate at a first temperature of less than about 600 degrees Celsius;
- and
- removing the inhibitor species from the dielectric surfaces with an oxidation process in a third processing chamber, different than the second processing chamber, while maintaining the substrate at a second temperature that is lower than the first temperature.
2 more elements
Dependencies are inferred from the claim text.