Circuit testing and manufacture using multiple timing libraries

A method, comprising:

• generating a first set of device characteristics for a set of circuit elements using a first set of input parameters;
• generating a first timing library for the set of circuit elements for a first targeted expected life, wherein the first timing library is generated using the first set of device characteristics;
• generating a second set of device characteristic for a subset of the set of circuit elements, wherein the second set of device characteristics are generated using a second set of input parameters;
• generating a second timing library for the second set of circuit elements for a second targeted expected life, wherein the second timing library is generated using a subset of the first set of device characteristics and the second set of device characteristics;
• and
• forming a circuit on a substrate, wherein the circuit includes the set of circuit elements.

A method, comprising:

• generating first device characteristics for a set of circuit elements in a circuit;
• generating second device characteristics for the set of circuit elements in the circuit;
• storing the device characteristics in a database;
• generating a first timing library using an aging model, a first subset of the circuit elements, and a first set of input parameters, wherein the first timing library is generated using the first device characteristics, and wherein the first timing library includes a first set of performance data for the set of circuit elements;
• generating a second timing library using the aging model, a second subset of the circuit elements, and a second set of input parameters, wherein the second timing library is generated using a subset of the first device characteristics and the second device characteristics, and wherein the second timing library includes a second set of performance data for the set of circuit elements;
• and
• forming the circuit on a substrate when the first set of performance data meets or exceeds a predetermined performance threshold.