Trade-off adjustments of memory parameters based on memory wear or data retention

A method comprising:

• performing, with a controller on a memory system, the following:
• periodically calculating, a wear for each block in at least a portion of the memory system, by:
• measuring a distribution of voltage states for cells in the blocks;
• measuring a change in shape of the distribution over a number of measurements;
• and
• quantizing the wear based on changes to the shape of the distribution;
• and
• dynamically adjusting trim parameters for each individual block independent-of other blocks based on the calculated wear for each of those individual blocks.

A storage device comprising a controller and memory blocks, wherein the controller is configured for:

• periodically determining, by generating a histogram, a cell voltage distribution of cells in the memory device during run time, wherein the histogram is generated periodically;
• measuring a change in shape and a change in location of the cell voltage distribution from the periodic determinations, wherein the shape corresponds to a shape of the cell voltage distribution, and the location corresponds to the location of the cell voltage distribution within the histogram;
• calculating a wear of the cells based on the shape change from the measured changes in the cell voltage distribution;
• calculating a data retention value of the cell based on the location change in the cell voltage distribution;
• and
• dynamically adjusting trim parameters of a block of cells based on the calculated data retention or the calculated wear.