Control system, control device, and control method
AssigneeOMRON Corporation
InventorsAtsushi Kitamura, Takahiro Toku
Life of this patent
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AssigneeOMRON Corporation
InventorsAtsushi Kitamura, Takahiro Toku
Estimating the term…
A control system that can adjust a period required for detecting an abnormality occurring in a control object is provided. The control system includes: feature quantity creating means that creates a feature quantity from data which is acquired from the control object based on a first parameter associated with elements defining the feature quantity; deviation acquiring means that acquires a degree of deviation between the feature quantity created by the feature quantity creating means and a group of feature quantities stored by a storage means based on a second parameter associated with a range in the group of feature quantities; abnormality detecting means that detects an abnormality occurring in the control object based on the degree of deviation acquired by the deviation acquiring means and a threshold value; and instruction means that instructs the deviation acquiring means to start execution based on an execution cycle of the deviation acquiring means.
A control system comprising:
A control device that controls a control object, the control device comprising:
A control method for a control device to control a control object, wherein the control device comprises a processor executing programs to implement the control method, the control method comprising:
Dependencies are inferred from the claim text.