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US 10,502,850 B2Granted
Interferometry-based data redatuming and/or depth imaging
AssigneeWesternGeco L.L.C.
InventorsIvan Pires De Vasconcelos, James E. Rickett
Life of this patent
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Abstract
Processing measurements to create “reflectivity” data at a datum for a target using Joint Point-Spread Functions. The “reflectivity” data can be an image or an extended image. The methods can create single reflectivity data from measurements from multiple experiments, or multiple processed datasets via different processing routes from measurements from a single experiment, or measurements from a single experiment with multiple simultaneous sources.
Claims21
A method for processing measurements at a datum, the method comprising:
- receiving at least two sets of measurements of a wavefield generated by at least one source emitting waves, the waves being disturbed by a subsurface target and received by at least one receiver;
- constructing a Joint Point Spread Function system using the at least two sets of measurements;
- obtaining reflectivity data by multi-dimensional deconvolution of the Joint Point Spread Function system;
- from the obtained reflectivity data, constructing or refining a physical model or image defining multiple subsurface structures;
- and
- from the model or image, identifying a location of a hydrocarbon deposit.
3 more elements
A method for processing measurements at a datum, the method comprising:
- receiving at least one set of measurements of a wavefield generated by at least two sources emitting waves simultaneously, the waves being affected by a subterranean target and received by at least one receiver;
- constructing a Joint Point-Spread Function system using the at least one set of measurements of the wavefield affected by the subterranean target caused by the at least two sources;
- and
- obtaining reflectivity data by multi-dimensional deconvolution of the Joint Point-Spread Function system;
- from the obtained reflectivity data, constructing or refining a physical model or image defining multiple subsurface structures;
- and
- from the model or image, identifying a location of a hydrocarbon deposit.
4 more elements
A system for processing information about or an image of a subterranean target, comprising:
- a first set of one or more sources configured to illuminate the subterranean target with a first wave signal;
- a second set of one or more sources configured to illuminate the subterranean target with a second wave signal;
- a first set of one or more receivers disposed at a first datum and configured to measure a first wavefield produced by interactions of the subterranean target with the first wave signal;
- a second set of one or more receivers disposed at a second datum and configured to measure a second wavefield produced by interactions of the subterranean target with the second wave signal, wherein either the first and the second datums are different or the first and the second datums are the same and the first set of one or more sources comprise sources that are different to the second set of one or more sources;
- and
- a processor configured to:
- construct a Joint Point-Spread Function system from the first and the second measured wavefields;
- process single reflectivity data from the Joint Point-Spread Function system;
- process single reflectivity data and construct an image defining multiple subsurface structures;
- and
- from the image, identify a location of a hydrocarbon deposit.
8 more elements
A method for processing information about or an image of a subterranean target, comprising:
- performing a first measurement process, wherein the first measurement process comprises illuminating the subterranean target with a first signal from a first set of one or more sources and using a first set of one or more receivers at a first datum to measure a first wavefield produced by an interaction between the subterranean target and the first signal;
- performing a second measurement process, wherein the second measurement process comprises illuminating the subterranean target with a second signal from a second set of one or more sources and using a second set of one or more receivers at a second datum to measure a second wavefield produced by an interaction between the subterranean target and the second signal, wherein either:
- the first and the second datums are the same and the first set of one or more sources comprise different types of sources than the second set of sources;
- or
- at least one of the first and the second datum are different, the first and the second signals are different, or location of the first set of one or more sources are different from locations of the second location of one or more sources;
- constructing a Joint Point-Spread Function system from the first and the second measured wavefields;
- processing single reflectivity data from the Joint Point-Spread Function system;
- processing the single reflectivity data, and from the processed single reflectivity data constructing or refining a physical model or image defining multiple subsurface structures;
- and
- from the model or image, identifying a location of a hydrocarbon deposit.
7 more elements
Dependencies are inferred from the claim text.