Determining transient error functional masking and propagation probabilities

A computerized apparatus comprising a processor configured to perform

• obtaining a representation of a circuit, wherein the circuit comprises nodes, wherein the nodes comprise at least one source-node and one destination-node;
• obtaining a trace of a reference execution, wherein the trace comprises recorded values of the nodes in a plurality of cycles that were computed during the reference execution;
• determining, by a processor, an Error Infliction Probability (EPP) of a pair of nodes, the pair comprising a source-node and a destination-node, wherein the EPP is a value representing a probability that a Transient Error (TE) happening on the source-node propagating to the destination-node in the same clock cycle it happened, wherein said determining comprises simulating a propagation of the TE from the source-node to the destination-node for plurality of cycles in the trace, wherein said simulating, in each cycle, utilizes values from the trace for nodes that are not influenced by the TE and that are in the Logic of Influence (LOI) of the destination-node, wherein the EPP is calculated as N/M, where N is the number of times the error propagated to destination-node, and M is the number of cycles examined;
• and
• outputting the EPP of the node.

A computer program product comprising a non-transitory computer readable storage medium retaining program instructions, which program instructions when read by a processor, cause the processor to perform:

• obtaining a representation of a circuit, wherein the circuit comprises nodes, wherein the nodes comprise at least one source-node and one destination-node;
• obtaining a trace of a reference execution, wherein the trace comprises recorded values of the nodes in a plurality of cycles that were computed during the reference execution;
• determining, by a processor, an Error Infliction Probability (EPP) of a pair of nodes, the pair comprising a source-node and a destination-node, wherein the EPP is a value representing a probability that a Transient Error (TE) happening on the source-node propagating to the destination-node in the same clock cycle it happened, wherein said determining comprises simulating a propagation of the TE from the source-node to the destination-node for plurality of cycles in the trace, wherein said simulating, in each cycle, utilizes values from the trace for nodes that are not influenced by the TE and that are in the Logic of Influence (LOI) of the destination-node, wherein the EPP is calculated as N/M, where N is the number of times the error propagated to destination-node, and M is the number of cycles examined;
• and
• outputting the EPP of the node.