Measurement method and apparatus for simultaneous correction of disturbance and offset of sensor
AssigneeKorea Electronics Technology Institute
InventorsWon Ki Park, Dae Sung Lee, Dong Sun Kim
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AssigneeKorea Electronics Technology Institute
InventorsWon Ki Park, Dae Sung Lee, Dong Sun Kim
Estimating the term…
A measurement method and apparatus for correcting a disturbance and an offset of a sensor simultaneously are described. The method includes applying a bias current to first and second sensors of a Wheatstone bridge type connected with each other as a differential structure, and measuring a voltage of the first sensor and a voltage of the second sensor. The method also includes applying a bias current to the first and second sensors in a direction opposite to the direction in the first applying, and measuring a voltage of the first sensor and a voltage of the second sensor. The method further includes calculating a final measurement value based on the measured voltages. Accordingly, the offset and the influence of the disturbance of the sensor can be simultaneously removed through one circuit, such that advantageous effects such as reduced complexity, reduced area/volume, and shortened correction time can be achieved.
A measurement method using a measurement apparatus comprising a first sensor and a second sensor of a Wheatstone bridge type connected with each other as a differential structure, the measurement method comprising:
A measurement apparatus comprising:
A measurement method using a measurement apparatus comprising a first sensor and a second sensor of a Wheatstone bridge type connected with each other as a differential structure, the measurement method comprising:
A The measurement apparatus comprising:
A non-transitory computer-readable recording medium which has a program stored thereon, for performing a measurement method comprising:
Dependencies are inferred from the claim text.