Identification and analysis of materials and molecular structures
AssigneeOndax, Inc.
InventorsJames Carriere, Lawrence Ho, Frank Havermeyer, Eric Maye, Randy Heyler
Life of this patent
Estimating the term…
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AssigneeOndax, Inc.
InventorsJames Carriere, Lawrence Ho, Frank Havermeyer, Eric Maye, Randy Heyler
Estimating the term…
Provided are methods and systems for identification and analysis of materials and molecular structures. An apparatus for identification and analysis of materials and molecular structures may include a laser. The laser may, in turn, include an amplified spontaneous emission-suppressed single-frequency laser excitation source. The apparatus may further comprise a plurality of filters. The plurality of filters may include reflective volume holographic grating blocking filters. The apparatus may also comprise an optical unit and an optical spectrometer. The optical unit may be configured to deliver excitation energy to a sample substance and capture Raman signal scattering from the sample substance. The optical spectrometer may be disposed in a path of the Raman signal and configured to measure a spectrum of the Raman signal and generate a detection signal. Finally, the apparatus may comprise a processing unit configured to analyze the spectrum.
A method for identification and analysis of materials and molecular structures comprising:
Dependencies are inferred from the claim text.