Laser processing system having measurement function
AssigneeFanuc Corporation
InventorsMinoru Nakamura, Yoshinori Murakami, Yuuki Takahashi
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AssigneeFanuc Corporation
InventorsMinoru Nakamura, Yoshinori Murakami, Yuuki Takahashi
Estimating the term…
A laser processing system having a measurement function. The laser processing system includes a processing head configured to irradiate an object with a laser beam in a scanning manner via an optical system for processing; an illumination-light emitting section provided in the processing head, and configured to cause illumination light to be emitted from the processing head toward the object along an optical axis of the optical system for processing; a light receiving section located in a predetermined positional relationship with the illumination-light emitting section, and configured to receive a reflection of the illumination light reflected at an irradiated point on the object; and a measurement section configured to process the reflection received by the light receiving section and obtain three-dimensional measurement data of the irradiated point.
A laser processing system, comprising:
A laser processing system for performing various types of laser processing, the laser processing system comprising:
A laser processing system for performing various types of laser processing, the laser processing system comprising:
A laser processing system for performing various types of laser processing, the laser processing system comprising:
A laser processing system for performing various types of laser processing, the laser processing system comprising:
Dependencies are inferred from the claim text.