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US 10,484,007 B2Granted
Semiconductor device
AssigneeSK hynix Inc.
InventorWoo Hyun Paik
Life of this patent
Estimating the term…
Abstract
Disclosed may be a repair information storage circuit. The repair information storage circuit may include a fuse set. A plurality of fuses included in the fuse set may be allocated to the respective bits of preliminary repair information and defect check information. The fuse allocated to the defect check information may be ruptured to store information on whether the fuse set has a defect.
Claims10
A semiconductor apparatus comprising:
- a repair information storage circuit comprising a fuse set for storing a preliminary repair information and a defect check information;
- an error calculation circuit configured to generate repair information according to the preliminary repair information, and generate a validity determination bit as one piece of information in the repair information, using the preliminary repair information and the defect check information, the validity determination bit defining whether the fuse set has a defect;
- and
- a repair processing unit configured to set a fuse set latch in a memory array block in an unavailable state according to the validity determination bit, wherein the memory array block is set to the corresponding fuse set in the unavailable state.
1 more element
Dependencies are inferred from the claim text.