Physical unclonable device and method of maximizing existing process variation for a physically unclonable device

A physically unclonable function (PUF) device comprising:

• a plurality of PUF cells, configured to generate an output, wherein each of the plurality of PUF cells comprising:
• an enable/disable complementary metal oxide semiconductor (CMOS) differential logic circuit (ECDL), comprising a first transistor, a second transistor, and a sense amplifier, wherein the sense amplifier comprising a first pair, a second pair and a bias transistor,
• the first pair forms an inverter circuit comprising a third transistor and a fourth transistor, and the second pair forms an inverter circuit comprising a fifth transistor and a sixth transistor,
• the third transistor and the fifth transistor are IO devices, wherein the IO devices use a predetermined voltage to power the PUF cells,
• the IO devices are selected to be smaller than a predetermined size defined according to a design rule check (DRC) and generate maximum variations among the plurality of PUF cells;
• and
• a pulse evaluation circuit, programmable to generate a pulse evaluation signal coupled to a control terminal of the second transistor,
• wherein after the pulse evaluation signal is stopped, the sense amplifier is enabled to translate difference between a bit line and the complementary bit line.