Apparatus and method for determining optimum stack number of RF switch

A method for determining an optimum stacking number of a radio frequency (RF) switch, in which a gate-off voltage and a body-off voltage are used to control transistors stacked in series to enter an OFF state, the method comprising:

• receiving a peak voltage of a high-frequency signal in a corresponding band, and a gate limiting voltage, a drain-source limiting voltage, and a body limiting voltage in a corresponding process for each of the transistors;
• calculating a gate terminal voltage, a drain-source voltage, and a body terminal voltage of each of the transistors;
• calculating a stacking number satisfying a gate stacking number condition in which the gate terminal voltage is lower than the gate limiting voltage;
• calculating a stacking number satisfying a both end stacking number condition in which the drain-source voltage is lower than the drain-source limiting voltage;
• calculating a stacking number satisfying a body stacking number condition in which the body terminal voltage is lower than the body limiting voltage;
• and
• determining the optimum stacking number based on a minimum stacking number among stacking numbers commonly satisfying the gate stacking number condition, the both end stacking number condition, and the body stacking number condition.

An apparatus comprising:

• a memory configured to store a peak voltage of a high-frequency signal and limiting voltages associated with transistors;
• a processor configured to calculate terminal voltages based on the limiting voltages stored in the memory and to determine an optimum stacking number of the transistors based on the limiting voltages and the terminal voltages;
• and
• a voltage generator configured to generate a gate-off voltage and a body-off voltage corresponding to the optimum stacking number determined by the processor.