Waveguide mount for microstrip circuit and material characterization
AssigneeUnited States of America as represented by the Administrator of NASA
InventorsKongpop U-Yen, Edward J. Wollack, Ari D. Brown
Life of this patent
Estimating the term…
Loading patent…
AssigneeUnited States of America as represented by the Administrator of NASA
InventorsKongpop U-Yen, Edward J. Wollack, Ari D. Brown
Estimating the term…
The present invention relates to a waveguide-to-microstrip line transition package for superconducting film characterization. The package allows propagation and impedance properties thin-film microwave line superconductor to be characterized at millimeter wave frequencies as a function of frequency. The superconducting film's kinetic inductance can be varied by applying direct current along the ground plane via spring loaded probe. When implemented with a non-superconducting metal housing the present invention is highly suitable for measuring resonators with the quality factor, Q, ranges from 100 to 1×104. Through the use of a housing realized from an appropriate superconducting bulk material or coating the upper end of this range of applicability can be readily extended to >1×106.
A superconducting film device comprising:
Dependencies are inferred from the claim text.